We build semiautomatic probe stations for custom applications where there is the opportunity to work with our customer to build a system to fit their unique application. Shown here is a compact automated 4” wafer probe station with a programmable X,Y,Z probing system, to simultaneously probe, resistor trim, test and record dies on a wafer. Not shown here is the Prober Microscope with
New Wave Research Laser. We built this system as low profile and compact
with the future intent of installing it in a high vacuum chamber to fulfill
another part of the customer’s requirement.